Size limits of magnetic-domain engineering in continuous in-plane exchange-bias prototype films

• Alexander Gaul,
• Daniel Emmrich,
• Timo Ueltzhöffer,
• Henning Huckfeldt,
• Hatice Doğanay,
• Johanna Hackl,
• Muhammad Imtiaz Khan,
• Daniel M. Gottlob,
• Gregor Hartmann,
• André Beyer,
• Dennis Holzinger,
• Slavomír Nemšák,
• Claus M. Schneider,
• Armin Gölzhäuser,
• Günter Reiss and
• Arno Ehresmann

Beilstein J. Nanotechnol. 2018, 9, 2968–2979, doi:10.3762/bjnano.9.276

• . Keywords: exchange bias; helium ion microscopy; ion bombardment induced magnetic patterning; magnetic domains; magnetic nanostructures; Introduction Engineered magnetic domains with deliberately set magnetic properties and designed shapes in thin-film systems have proven to be useful in memory [1][2] and

• experimentally found (d = 5 μm). Conclusion By employing the helium ion beam of a scanning helium ion microscope defocused to 8 nm for mask-less ion bombardment induced magnetic patterning a prototypical in-plane exchange-biased layer system has been modified locally with a resulting patterned spot of less than